Rothstein Associates Inc.

DESIGN FOR RELIABILITY
by Dana Crow (Editor), Alec Feinberg (Editor)

"This book is definitely a strong addition to the body of knowledge for Reliability
professionals and for any company that wants to improve the business
competitiveness by
improving product reliability…I have been fortunate to know [the DfR activity at
M/A-COM/Tyco] and I also know how impressed other organizations are when they
get to
see
it. This is an outstanding industry leader that has documented the implemented
practice in
this book."
- James E. "Gene" Bridgers, RESULTS MA

= = = = = = =

"…is a practical and useful book …description of the "stage gate
approach"…emphasis on
accelerated test methods…description of physics of failure and failure investigation
techniques…"
- Patrick O'Connor, author of Practical Reliability Engineering

= = = = = = =

“Engineers at the M/A-COM Tyco Electronics revise the company's manual of the
same title,
which explains to engineers and managers how the design for reliability approach
can
enhance the concurrent design cycles. They argue that the stage gate process
provides the
maximum level of benefit to the design while minimizing the cycle time impact to
that
process,
producing the highest levels of product reliability possible. The topics include
understanding
customer requirement, screening and monitoring, semiconductor process
reliability,
analytical physics, concepts in accelerated testing, and evaluating product risk.”
Book News,
Inc., Portland, OR (booknews.com)

= = = = = = =

“Today's marketplace demands product reliability. At the same time, it places
ever-increasing demands on products that push the limits of their performance and
their
functional life, and it does so with the expectation of lower per-unit product costs.
To meet
these demands, product design now requires a focused, streamlined, concurrent
engineering
process that will produce a product at the lowest possible cost in the least amount
of time.

“Design for Reliability provides a systematic approach to the design process that is
sharply
focused on reliability and firmly based on the physics of failure. It imparts an
understanding of
how, why, and when to use the wide variety of reliability engineering tools available
and
offers
fundamental insight into the total design cycle. Applicable from the idea phase of
the product
development cycle through product obsolescence, Design for Reliability (DfR)
concepts
integrated with reliability verification and analytical physics form a coherent stage
gate/phase
design process that helps ensure that a product will meet customers' reliability
objectives.

“Whether you are a high-volume manufacturer of consumer items or a low volume
producer
of
military commodities, your goal is the same: to bring a product to market using a
process
focused on designing out or mitigating potential failure modes prior to production
release.
Readers of Design for Reliability will learn to meet that goal and move beyond
solidifying a
basic offering to the marketplace to creating a true competitive advantage.”

= = = = = = =

FROM THE AUTHOR

“As one of the authors/editors of this book, let me describe the valuable technical
content.
First, let me impress upon you that this is a rare practical work in reliability written
by
members of a highly technical company that apply reliability science every day to
products.
Thus, academics are stressed only as a tool. Therefore, this book has something
for
everyone. It starts off with a management perspective on how to organize a
reliability
program. Chapter 1 - 5 overview a unique stage-gate approach to growing reliability.
What
tools and building blocks are needed from a management perspective to be
world-class.
What tests to perform when is also key. This approach assures optimum reliability
grow in a
commercial atmosphere of on-time reliable product deliveries. The book then
evolves
technically providing essential engineering topics. Chapter 6 describes key
information for
performing process reliability studies. Chapter 7, is without question a compact
chapter on
failure analysis that describes each analysis tool including SEM, SAM, EDS,
FTIR, FIB,
SIMS, etc. The numerous physics of failure analysis examples in diffusion,
corrosion,
intermetallics, ESD etc are illustrated with detailed FA images. Then Chapter 8
provides
what you need to know for reliability statistics. It covers basic definitions for failure
rate, CDF,
PDF, the main distributions used (Weibull, lognormal, Exponential, Normal). A
well-organized
chapter presenting key essential reliability statistics needed in industry. Chapter 9
details
accelerated testing, the primary historical equations governing temperature,
temperature-humidity, vibration and temperature cycle/shock, and electromigration.
It
provides common sense guidelines for assessing overstressing. How to use these
equations
for test planning. Advance topics including Step-stress and how to describe life
distributions
as a function of stress. Chapter 10 on Accelerated Reliability Growth is fairly
unique. What
tests do you perform and when, using stage-gate and recent accelerated reliability
growth
mathematics for planning. Growth can be obtained and assessed in a timely
manner.
Chapter 11 provides the essential for system reliability. Series, parallel, and n of k
subsystems as well as predicting reliability using both Bellcore, and 217 methods
are
addressed. Chapter 12 is an excellent overview of FMEA. Chapter 13 teaches
methods for
evaluating product risk and conducting risk program management. Lastly, Chapter
14 is an
advanced topic, thermodynamic reliability engineering. No other book teaches
thermodynamics and how the 1st and 2nd laws are fundamental to the science for
Physics-of-Failure. In no other book can a reader find derivations for accelerated
testing time
compression expressions in fatigue, temperature-humidity, Miner?s rule, and
diffusion.
Additionally, an advanced Arrhenius kinetic topics on logarithmic-in-time aging are
provided.
This topic as a seminar received the highest ratings at the 2001 RAMS
conference. Thank
You” - Alec Feinberg.

= = = = = = =

TABLE OF CONTENTS

The Stage Gate Process
Reliability Science
Understanding Customer Requirements
Design Assessment Reliability Testing
Design Maturity Testing (DMT)
Screening and Monitoring
Supporting Stage Gate
Semiconductor Process Reliability
Analytical Physics
Topics in Reliability
Reliability Statistics Simplified
Concepts in Accelerated Testing
Accelerated Reliability Growth
Reliability Predictive Modeling
Failure Modes and Effects Analysis
Evaluating Product Risk
Thermodynamic Reliability Engineering


= = = = = =
2001, 256 pages. Order #DR591.
= = = = = =

4 Arapaho Rd.

Brookfield, CT 06804-3104

1-888-ROTHSTEin

Telephone: 203.740.7444; 888.768.4783

Fax: 203.740.7401

All bookstore enquiries should be sent to Rothstein Associates at the above address.